The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Nov. 30, 2006
Xiaoxun Zhu, Marlton, NJ (US);
Yong Liu, Suzhou, CN;
Ka Man AU, Philadelphia, PA (US);
Rui Hou, Suzhou, CN;
Hongpeng Yu, Tianjin, CN;
Xi Tao, Suzhou, CN;
Liang Liu, Suzhou, CN;
Wenhua Zhang, Suzhou, CN;
Anatoly Kotlarsky, Holland, PA (US);
Sankar Ghosh, Boothwyn, PA (US);
Michael Schnee, Aston, PA (US);
Pasqual Spatafore, Marlton, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Sung Byun, Cherry Hill, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
Garrett Russell, Wilmington, DE (US);
John Bonanno, Woodbury, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Yong Liu, Suzhou, CN;
Ka Man Au, Philadelphia, PA (US);
Rui Hou, Suzhou, CN;
Hongpeng Yu, Tianjin, CN;
Xi Tao, Suzhou, CN;
Liang Liu, Suzhou, CN;
Wenhua Zhang, Suzhou, CN;
Anatoly Kotlarsky, Holland, PA (US);
Sankar Ghosh, Boothwyn, PA (US);
Michael Schnee, Aston, PA (US);
Pasqual Spatafore, Marlton, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Sung Byun, Cherry Hill, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
Garrett Russell, Wilmington, DE (US);
John Bonanno, Woodbury, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
A portable digital image capturing and processing system comprising: an image formation and detection subsystem; a narrow-band illumination subsystem; a narrow-band transmission-type optical filter subsystem; an automatic light exposure measurement subsystem; and an automatic illumination control subsystem. The image formation and detection subsystem has an area-type image sensing array for detecting digital images of objects formed thereon by image formation optics providing a field of view (FOV) for the system. Within the FOV of the image formation and detection subsystem, the narrow-band illumination subsystem produces a field of narrow-band illumination consisting essentially of a narrow band of wavelengths of visible illumination. The narrow-band transmission-type optical filter subsystem transmits substantially only the narrow band of wavelengths of visible illumination produced from the narrow-band illumination subsystem, and rejects all other optical wavelengths outside the narrow band however generated by ambient illumination sources. The automatic light exposure measurement subsystem employs a photo-detector operated independently from the area-type image sensing array, for automatically measuring the light exposure incident upon a selected portion of the FOV, and producing an electrical signal representative of the light exposure measurement. Only when all sensor elements in the image-sensing sensing array are activated and in state of integration, then narrow-band illumination is produced for illuminating objects in FOV of the system and simultaneously detected by a photo-detector for measuring light exposure within the FOV, and also by an area-type image sensing array for detecting a digital image of said illuminated object.