The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

May. 17, 2003
Applicants:

Robert E. Sinclair, Sammamish, WA (US);

Patricia M. Wagoner, Redmond, WA (US);

Heather S. Burns, Redmond, WA (US);

Paul J. Reid, Woodinville, WA (US);

Brendan Mckeon, Seattle, WA (US);

Inventors:

Robert E. Sinclair, Sammamish, WA (US);

Patricia M. Wagoner, Redmond, WA (US);

Heather S. Burns, Redmond, WA (US);

Paul J. Reid, Woodinville, WA (US);

Brendan McKeon, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 3/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Control patterns are used to describe functionality that may be exposed by one or more types of elements or controls. Functionality that is common among two or more types of elements is described by the same control pattern. Certain predefined methods, structures, properties, and/or events may be associated with a particular control pattern. Elements that support the control pattern, when queried, return an interface that describes those methods, structures, properties, and/or events. Control patterns are mutually exclusive in the functionality they represent, so they may be combined in arbitrary ways to expose the complete set of functionality offered by a particular control.


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