The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Nov. 16, 2005
Sung-hee Hwang, Suwon-si, KR;
Jung-wan Ko, Suwon-si, KR;
Hyo-jin Sung, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of determining whether a defect exists on an information storage medium is provided along with a recording/reproducing apparatus using the same. Such a method comprises: seeking a defect entry whose state information indicates that a defect block or a replacement block has been re-initialized without certification from a defect list for managing an information storage medium and including state information of the defect block and state information of the replacement block, wherein the medium includes a spare area for recording the replacement block to replace the defect block occurring in a user data area on the medium; and certifying the defect block or the replacement block registered in the sought defect entry. As a result, defect information can be effectively rearranged for quick re-initialization without certification in order to improve the performance of a drive system.