The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

Dec. 28, 2006
Applicants:

Kaoru Yasukawa, Kanagawa, JP;

Koji Adachi, Kanagawa, JP;

Koki Uwatoko, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Norikazu Yamada, Kanagawa, JP;

Eigo Nakagawa, Kanagawa, JP;

Inventors:

Kaoru Yasukawa, Kanagawa, JP;

Koji Adachi, Kanagawa, JP;

Koki Uwatoko, Kanagawa, JP;

Tetsuichi Satonaga, Kanagawa, JP;

Norikazu Yamada, Kanagawa, JP;

Eigo Nakagawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure prevention diagnosis support system includes: an acquiring portion that acquires internal information about an internal state of an image forming apparatus; a storage portion that stores one or a plurality of logistic regression models that define an estimate value of a regression coefficient through a logistic regression analysis using the internal information obtained when the image forming apparatus is in a failed state and in a normal state; and a controller that performs a control operation to select a logistic regression model from the one or the plurality of the logistic regression models stored in the storage portion in accordance with the image forming apparatus, and to calculate risk degrees as objective variables that are indicators of failure degrees in the image forming apparatus by assigning the internal information acquired by the acquiring portion or the value obtained from the internal information to the selected logistic regression model.


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