The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

Apr. 19, 2005
Applicants:

Seung Hyun Jang, Jeju-si, KR;

Chul Soo Lee, Daejeon, KR;

Eui Suk Jung, Daejeon, KR;

Byoung Whi Kim, Daejeon, KR;

Inventors:

Seung Hyun Jang, Jeju-si, KR;

Chul Soo Lee, Daejeon, KR;

Eui Suk Jung, Daejeon, KR;

Byoung Whi Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring Optical Beat Interference (OBI) noise is applied to a central office in a Subcarrier Multiple Access (SCMA) optical network. The central office includes an optical receiver for converting an optical signal received through an optical fiber into an electrical signal. The OBI noise measurement apparatus includes a power divider, first and second filters, and a power measurement unit. The power divider divides the power of a signal output from the optical receiver into two signals. The first filter passes one of the two signals divided by the power divider in a low band of frequencies below a band of subcarrier signals. The second filter passes the other of the two signals divided by the power divider in a high band of frequencies above the band of subcarrier signals. The power measurement unit measures the power of each signal passed through the first and second filters.


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