The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

Sep. 05, 2006
Applicants:

Julian Stoev, Seoul, KR;

Jun-seok Shim, Seongnam-si, KR;

Sang-eun Baek, Inchen Metropolitan, KR;

Inventors:

Julian Stoev, Seoul, KR;

Jun-seok Shim, Seongnam-si, KR;

Sang-eun Baek, Inchen Metropolitan, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/596 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a hard disk drive (HDD), biases are measured across all zones of a disk, and nonlinear bias components are extracted. Upon a change in operational condition of the HDD, biases are measured at two reference positions on the disk so as to estimate a corresponding change in a linear bias component across all zones of the disk. The bias at a given position of the disk is then calculated based on the estimated linear bias component and the extracted nonlinear bias component.


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