The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
May. 02, 2007
Gyoung IL Cho, Seoul, KR;
Jin Young Sohn, Fullerton, CA (US);
Sang Hyune Baek, Suwon, KR;
Cheong Soo Seo, Seongnam, KR;
Gyoung Il Cho, Seoul, KR;
Jin Young Sohn, Fullerton, CA (US);
Sang Hyune Baek, Suwon, KR;
Cheong Soo Seo, Seongnam, KR;
Angstrom, Inc., Seongnam, KR;
Stereo Display, Inc., Anaheim, CA (US);
Abstract
This invention provides a Hybrid Micromirror Array Lens with reduced chromatic aberration over a broadband wavelength range of light. Conventional micromirror array lens uses phase matching condition. Therefore, the optical surface profile of Micromirror Array Lens using the same phase condition has a discontinuous surface profile. As the required optical power of Micromirror Array Lens is increased, the number of profile discontinuity of Micromirror Array Lens is increased. Therefore, the chromatic aberration is increased. To minimize the chromatic aberration, the number of profile discontinuity should be minimized. The number of discontinuity is reduced when the optical surface profile has a simulating base curve, called a translation contour with optical power. Hybrid Micromirror Array Lens is invented to reduce a large translational amount and chromatic aberration for large optical power lens.