The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

Jun. 15, 2004
Applicants:

Huy A. Nguyen, Hanoi, VN;

Mikel J. Stanich, Longmont, CO (US);

Gerhard R. Thompson, Wappingers Falls, NY (US);

Chai W. Wu, Poughquag, NY (US);

Inventors:

Huy A. Nguyen, Hanoi, VN;

Mikel J. Stanich, Longmont, CO (US);

Gerhard R. Thompson, Wappingers Falls, NY (US);

Chai W. Wu, Poughquag, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A halftone spot function, for determining a shape of a halftone spot as a function of the intensity of an image being printed, is generated by creating one or two line segments forming a part of the shape of the spot function or by creating a number of contour lines that are interpolated to form the function. A halftone spot pattern is generated as a number of supercells, each of which includes a number of halftone spots, each defined within a halftone spot cell by a halftone spot function, with the supercell being defined to include a number of device pixels, each of which is fully inked of left without ink, a number of spot cells in each direction, and offset distance establishing angles of the lines dividing the spot cells from one another.


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