The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
May. 24, 2007
David C. Chu, Palo Alto, CA (US);
Evan R. Whitney, Saratoga, CA (US);
David C. Chu, Palo Alto, CA (US);
Evan R. Whitney, Saratoga, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A system for sensing an absolute two-dimensional position of an object having a two-dimensional target pattern thereon comprises a sensor and a controller. The sensor is for capturing an image of a subset of the target pattern. The controller is for generating a first image vector representing summations of rows of pixel values from the image, and a second image vector representing summations of columns of pixel values from the image. The controller is configured to determine an absolute two-dimensional position of the subset of the target pattern with respect to the origin of the target pattern based on the first image vector, the second image vector and target vectors that represent the target pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile