The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Aug. 08, 2007
Applicants:
Scott William Petrick, Sussex, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Frank Gao, Naperville, IL (US);
Inventors:
Scott William Petrick, Sussex, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Frank Gao, Naperville, IL (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems, methods and apparatus are provided through which in some embodiments field-effect-transistor (FET) leakage is estimated recursively from a pixel value obtained when the FET is off. The corrected pixel value is then obtained by subtracting the FET leakage estimate from the pixel value read when the FET is on. A weighing factor is introduced for the FET leakage estimation to achieve the balance between image noise and correction resolution.