The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Nov. 30, 2005
Wen LI, Clifton Park, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
Yanfeng Du, Rexford, NY (US);
James Leblanc, Niskayuna, NY (US);
Wen Li, Clifton Park, NY (US);
John Eric Tkaczyk, Delanson, NY (US);
Yanfeng Du, Rexford, NY (US);
James Leblanc, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
Count rates may be obtained from one or more subpixels for a given pixel in an imaging system detector. Count rates may be obtained from individual subpixels, or may be from electronically binned subpixels at least in part in various subpixel arrangements where a selected subpixel arrangement may be adaptively set according to a detected count rate. For lower count rates, two or more subpixels may be electronically binned together and the counts may be obtained from the binned subpixels, for example to mitigate a charge sharing effect. For higher count rates, the count rates of a greater number of subpixels may be individually obtained, for example to mitigate a pulse pile-up effect. Detective quantum efficiency may be optimized over a wider range of photon flux rate via the adaptive subpixel arrangement.