The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Jun. 02, 2006
Mahesh Ajgaonkar, Holland, PA (US);
Gerard A. Alphonse, Princeton, NJ (US);
Mahesh Ajgaonkar, Holland, PA (US);
Gerard A. Alphonse, Princeton, NJ (US);
Medeikon Corporation, Holland, PA (US);
Abstract
A multi-channel low coherence interferometer having sensing and reference arms, at least one of which has variable delay. The sensing arm includes an optical switch for connecting to two or more probe arms. The distal ends of the probe arms collect source light backscattered from a sample. The backscattered light collected by the distal end of a probe arm is combined with reference light and a low coherence interferometric signal is produced by a sweep of a variable delay of the device or a sweep of a variable frequency laser light source. The interference signal produced by the interaction of reference and sensing light at a detector measures backscattered light, which may be used to characterize the sample. The low coherence interferometric signals can provide information about the morphology, physical nature, composition, and properties of the sample. The device may be used to discriminate between finished surfaces and corroded surfaces, healthy and diseased tissue, and can sample the material or tissue in two or more areas. Versions of the invention include devices that are interferometers and or autocorrelators.