The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Aug. 31, 2006
Applicant:
Koichi Kobayashi, Tokyo, JP;
Inventor:
Koichi Kobayashi, Tokyo, JP;
Assignee:
Kabushiki Kaisha, , JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A non-contacting strain measurement method and system employs a laser light source for irradiating a test piece to provide a spectral pattern in spaced relationship from the test piece. The pattern is viewed while the test piece is placed under tension by a plurality of video cameras. The CCD video cameras are coupled to signal processing circuits which calculate the Poisson ratio according to the formula: