The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Apr. 06, 2006
Applicants:

Jung-kuk Lee, Yongin-si, KR;

Seung-jin Seo, Suwon-si, KR;

You-keun Han, Yongin-si, KR;

Seung-man Shin, Suwon-si, KR;

Young-man Ahn, Yongin-si, KR;

Inventors:

Jung-kuk Lee, Yongin-si, KR;

Seung-jin Seo, Suwon-si, KR;

You-keun Han, Yongin-si, KR;

Seung-man Shin, Suwon-si, KR;

Young-man Ahn, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, GYeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory module testing apparatus and method include a test slot adapted to receive a target memory module, wherein the target memory module includes a first memory unit to store information related to the target memory module. The memory module testing apparatus further includes a second memory unit adapted to store information related to a memory module, and a first switching unit adapted to selectively provide a driving signal to at least one of the first memory unit and the second memory unit.


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