The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Sep. 27, 2007
Sven Vogler, Heidelberg, DE;
Roland Kaplan, Heidelberg, DE;
Robert Weikert, Lauf, DE;
Roelof Wijnaendts-van-resandt, Bad Schoenborn, DE;
Sven Vogler, Heidelberg, DE;
Roland Kaplan, Heidelberg, DE;
Robert Weikert, Lauf, DE;
Roelof Wijnaendts-Van-Resandt, Bad Schoenborn, DE;
Heidelberg Instruments Mikrotechnik GmbH, Heidelberg, DE;
Abstract
A method for optically detecting the position of a moveable test object (), especially a mirror or reflector, in which a measuring beam () produced by a light source () is reflected by the test object (and reaches a position-sensitive light detector () which carrier out a conversion into information corresponding to the position of the test object (). The invention enables the position of mirrors, especially rotating mirrors, to be quickly measured optically using a simple optical construction. The measuring beam () is focused onto the light detector () by an optical system (). A signal corresponding to the geometric center or the maximum (I) of the intensity distribution of the focused measuring spot is determined based on the measured values obtained by the light detector ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile