The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Feb. 12, 2003
Applicants:

Farhad A. Ghelmansarai, Danville, CA (US);

Francisco Miguel Hernandez-guerra, Concord, CA (US);

Inventors:

Farhad A. Ghelmansarai, Danville, CA (US);

Francisco Miguel Hernandez-Guerra, Concord, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system to acquire a first image of a radiation field, the radiation field produced by a radiation beam, and to determine a second image based on the first image and based on a reference image of a reference radiation field having substantially homogeneous intensity, the second image representing characteristics of the radiation beam. Some embodiments provide acquisition of a first profile associated with a radiation beam using a radiation detection device, acquisition of a first image of a first radiation field produced by the radiation beam using an imaging device, determination of a map between the first image and the first profile, acquisition a second image of a second radiation field using the imaging device, and determination of a second profile based on the map and the second image.


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