The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Apr. 09, 2007
Applicant:
Yoichi Oikawa, Sapporo, JP;
Inventor:
Yoichi Oikawa, Sapporo, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01); G02B 6/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
The distance between an optical diffraction device and a focusing lens, and the coefficient of the focal length change of the focusing lens, are adjusted based on the calculation expression of wavelength identification errors in light of temperature change of a member making up light receiving means (e.g., PD array), thereby performing correction of wavelength identification errors, whereby optical wavelength identification can be performed with high precision even when the temperature changes.