The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Mar. 17, 2005
Applicants:

Yan Zhang, Kokomo, IN (US);

Ronald M. Taylor, Greentown, IN (US);

Robert A. Perisho, Jr., Russiaville, IN (US);

Inventors:

Yan Zhang, Kokomo, IN (US);

Ronald M. Taylor, Greentown, IN (US);

Robert A. Perisho, Jr., Russiaville, IN (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for enhancing the contrast within an image. An enhanced image can be generated in a real-time or substantially real-time manner from an initial image. The pixel values of the initial image can be used to populate a histogram or otherwise serve as the basis for subsequent processing. A valley can be identified within the range of pixel values for use as a stretch metric used by a stretch heuristic to expand the contrast of the pixel values in the initial image by expanding the range of pixel values associated with the pixels in the histogram. In some embodiments, the initial image is first divided into image regions that are each associated with individualized processing. A bilinear interpolation step can then be performed to smooth the integrated image after the individualized processing is used to stretch the pixels within the individual image regions.


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