The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Oct. 13, 2004
Atsushi Aizawa, Yamanashi, JP;
Toshinari Tamura, Gotenba, JP;
Atsushi Aizawa, Yamanashi, JP;
Toshinari Tamura, Gotenba, JP;
Fanuc Ltd, Yamanashi, JP;
Abstract
A three-dimensional measurement apparatus of a slit light (or pseudo slit light) projection type that is adapted to prevent deterioration of measurement accuracy and to be easily miniaturized. Detected positions C, Care adopted that are determined so as to correspond to scanning lines on each of which a number of brightened pixels falls within an allowable range are detected. The allowable range varies from Nav × amin to Nav × amax or from Nav−β to Nav +γ, where Nav is an average of the numbers of brightened pixels detected on scanning lines for each of which at least one pixel is determined, and amin, amax, β, and γ are minimum proper ratio, maximum proper ratio, subtract number of pixels, and add number of pixels, respectively, which are set in advance as parameters.