The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Mar. 25, 2005
Applicants:

Hajime Asama, Wako, JP;

Atsushi Morimoto, Nakano-ku, JP;

Masaomi Nishimura, Nagareyama, JP;

Inventors:

Hajime Asama, Wako, JP;

Atsushi Morimoto, Nakano-ku, JP;

Masaomi Nishimura, Nagareyama, JP;

Assignee:

Riken, Saitama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An action analysis method comprising: an image recording step for continuously photographing a target; a movement locus measuring step for obtaining a movement locus of the target; an action analysis step for analyzing an action of the target from the movement locus; and an output step. In the action analysis step, a speed v and a movement direction displacement angle θ for each unit time is obtained from the movement locus; an average value X of v·cos θ for each unit time within a predetermined time is obtained; and a predetermined extraction target is distinguished by a statistic measure using the average value as an operation element index.


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