The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

May. 09, 2006
Applicants:

Jonathan S. Maltz, Oakland, CA (US);

Zirao Zheng, Petaluma, CA (US);

Michelle M. Svatos, Oakland, CA (US);

Inventors:

Jonathan S. Maltz, Oakland, CA (US);

Zirao Zheng, Petaluma, CA (US);

Michelle M. Svatos, Oakland, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/02 (2006.01); G01N 23/20 (2006.01); G01N 23/201 (2006.01); H01L 27/146 (2006.01); H01J 37/295 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is between the megavoltage radiation source and the imaging device, and determination of an amount of scatter radiation based at least on areas of the acquired image corresponding to the plurality of elements. In some aspects, at least one of the plurality of elements is substantially pointed toward a focal spot of the megavoltage radiation source.


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