The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Nov. 17, 2006
Applicants:
Jianping LU, Chapel Hill, NC (US);
Otto Z. Zhou, Chapel Hill, NC (US);
Qi Qiu, Cary, NC (US);
Inventors:
Assignee:
Xintek, Inc., Research Triangle Park, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for x-ray imaging and scanning of objects are disclosed. According to one aspect, the subject matter described herein can include providing an x-ray source configured to generate a plurality of individually-controllable x-ray beams, positioning an object to be imaged in a path for intercepting at least one of the x-ray beams, activating the x-ray source, detecting intensities of the emitted x-ray beams, and generating imaging data based on the intensities for constructing an image of the object.