The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Oct. 11, 2007
Masakazu Suzuki, Kyoto, JP;
Takahiro Yoshimura, Kyoto, JP;
Makoto Honjo, Kyoto, JP;
J. Morita Manufacturing Corporation, Kyoto, JP;
Abstract
There is provided a new X-ray imaging apparatus by the use of which X-ray CT and panoramic imaging can be effectively performed. In an X-ray imaging apparatus which rotates an X-ray generating section and an X-ray detecting section around an imaging object arranged between these X-ray generating section and the X-ray detecting section and also detects in the X-ray detecting section X-rays having been radiated from the X-ray generating section and transmitted through the imaging object to form an X-ray image, a panoramic imaging mode in which the X-ray generating section and the X-ray detecting section are driven to form a panoramic image of the imaging object and an offset scan/CT mode in which the X-ray generating section and the X-ray detecting section are driven to form a tomographic image of the imaging object are set, so as to selectively execute these two imaging modes. Consequently, the panoramic imaging mode and the offset scan/CT mode can be arbitrarily selected, thereby allowing formation of an X-ray imaged image that is optimum for treatment.