The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Sep. 02, 2006
Peter Lehmann, Göttingen, DE;
Peter Lücke, Karlsruhe, DE;
Jürgen Mohr, Sulzfeld, DE;
Carlos Javier Moran-iglesias, Stutensee, DE;
Wolfgang Osten, Lilienthal, DE;
Aiko Ruprecht, Stuttgart, DE;
Sven Schönfelder, Löwenstein, DE;
Peter Lehmann, Göttingen, DE;
Peter Lücke, Karlsruhe, DE;
Jürgen Mohr, Sulzfeld, DE;
Carlos Javier Moran-Iglesias, Stutensee, DE;
Wolfgang Osten, Lilienthal, DE;
Aiko Ruprecht, Stuttgart, DE;
Sven Schönfelder, Löwenstein, DE;
Carl Mahr Holding GmbH, Göttingen, DE;
Abstract
A measuring head () according to the invention comprises the combination of a zone lens (), which is preferably a diffractive lens, with a hemispherical lens () or a GRIN lens (). This represents a concept capable of miniaturization, resulting in very slender measuring heads () having a high numeric aperture and, accordingly, leads to the best resolution capacity. Such measuring heads are insensitive to angular errors as concerns the orientation of the measuring head to the surface to be measured or to an oblique positioning of the surface relative to the optical axis of the measuring head.