The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Jan. 09, 2006
Satoshi Imaizumi, Hoi-gun, JP;
Satoshi Imaizumi, Hoi-gun, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A lens meter having a simple configuration, which is capable of precisely measuring optical characteristics such as refractive power distribution in a wide range of a subject lens to be measured at a time. The lens meter has a projection unit which projects a measurement light bundle, a projection lens which projects the measurement light bundle from the projection unit onto the subject lens placed on an optical axis of the projection lens, a diaphragm having an aperture disposed between the projection unit and the projection lens, and a two-dimensional photodetector which photo-receives the measurement light bundle passed through the subject lens after passed through the aperture of the diaphragm and the projection lens, and wherein the projection unit forms a target pattern, and the aperture of the diaphragm is disposed at a front focal point of the projection lens.