The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Oct. 02, 2003
Applicants:

Hideaki Yajima, Osaka, JP;

Masaki Horiuchi, Katano, JP;

Inventors:

Hideaki Yajima, Osaka, JP;

Masaki Horiuchi, Katano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A grab accepting section receives a request from a grab window to grab a desired key event over a focus window. A grab requesting section which retains key event request sets that may be issued until the time a key event corresponding to the user's operation result is ascertained, requests a window system to notify all of the key events belonging to the key event request set which includes the key event that the grab window desires to acquire. Thus, in a situation where operation results of a key, which is assigned with a plurality of functions, are notified as different virtual key events for the respective functions depending on the manner the key is operated, malfunctioning due to the grab window grabbing a particular key event via the window system is avoided.


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