The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Oct. 05, 2005
Applicants:

Yan-rung Lin, Wandan Township, Pingtung County, TW;

Shie-chang Jeng, Ligang Township, Pingtung County, TW;

Chi-chang Liao, Tainan, TW;

Jow-tsong Shy, Hsinchu, TW;

Inventors:

Yan-Rung Lin, Wandan Township, Pingtung County, TW;

Shie-Chang Jeng, Ligang Township, Pingtung County, TW;

Chi-Chang Liao, Tainan, TW;

Jow-Tsong Shy, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method provides for inspecting flexible display medium layer, on which a driving electrode structure to be formed is not complete or there is no driving electrode structure. The flexible display medium layer passes an inspection area. Then, the inspected method is applied to inspect a performance of the flexible display medium layer on a corresponding region being passing the inspection area. The inspected results are recorded, in which the information for indicating a functional performance of the flexible display medium layer is recorded or shown according to a performance level. An apparatus can inspect the flexible display medium layer in accordance with the foregoing method.


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