The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Apr. 20, 2007
Charles A. Mckenzie, London, CA;
Anja Brau, Menlo Park, CA (US);
Huanzhou Yu, Mountain View, CA (US);
Scott B. Reeder, Middleton, WI (US);
Jean H. Brittain, Middleton, WI (US);
Ann Shimakawa, Palo Alto, CA (US);
Charles A. McKenzie, London, CA;
Anja Brau, Menlo Park, CA (US);
Huanzhou Yu, Mountain View, CA (US);
Scott B. Reeder, Middleton, WI (US);
Jean H. Brittain, Middleton, WI (US);
Ann Shimakawa, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for generating a self-calibrating parallel multiecho magnetic resonance image is provided. A magnetic resonance imaging excitation is applied. A first echo at a first echo time in a first pattern is acquired. A second echo at a second echo time different from the first echo phase in a second pattern different from the first pattern is acquired. The acquired first echo and acquired second echo are used to generate an image in an image pattern, wherein none of the acquired echoes for generating the image have the same pattern as the image pattern.