The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Dec. 07, 2006
Marc Vanden Bossche, Bornem, BE;
Marc Vanden Bossche, Bornem, BE;
NMDG NV, Bornem, BE;
Abstract
A measurement system for determining at least one characteristic of a device under test (DUT) at at least one frequency is described. The measurement system includes a network analyzer being in connection at least with a first source via a first connector and a second source via a second connector. Each source generates a signal. The network analyzer further includes signal paths arranged for applying the generated signals to the DUT and arranged for receiving signals output by the DUT. The frequency content of the signal generated by the second source includes at least a frequency component offset from the at least one frequency at which the DUT is characterized, the at least one frequency being included in the frequency content of the signal generated by the first source.