The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2009

Filed:

Apr. 08, 2004
Applicants:

Philippe Goix, Oakland, CA (US);

Paul J. Lingane, Oakland, CA (US);

Inventors:

Philippe Goix, Oakland, CA (US);

Paul J. Lingane, Oakland, CA (US);

Assignee:

Guava Technologies, Inc., Hayward, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 21/00 (2006.01); F21V 9/16 (2006.01); C02F 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multicolor particle analyzer and method is described. The particles each of which either naturally fluoresce or are tagged to fluoresce at distinctive wavelengths are caused to flow through an analyzing volume where fluorescence is excited by an impinging light beam. A tunable optical filter repetitively and sequentially passes emitted light at each of the characteristic wavelengths as each particle travels through the analyzing volume and the light transmitted through the optical filter is received by single detector which provides output signals representative of each distinct wavelength of light emitted by the particle.


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