The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Jun. 15, 2006
Paul J. Zombo, Cocoa, FL (US);
Robert E. Shannon, Oviedo, FL (US);
Max Rothenfusser, Munich, DE;
Matthias Goldammer, Munich, DE;
Christian Homma, Vaterstetten, DE;
Joachim Baumann, Munich, DE;
Paul J. Zombo, Cocoa, FL (US);
Robert E. Shannon, Oviedo, FL (US);
Max Rothenfusser, Munich, DE;
Matthias Goldammer, Munich, DE;
Christian Homma, Vaterstetten, DE;
Joachim Baumann, Munich, DE;
Siemens Energy, Inc., Orlando, FL (US);
Abstract
A hand-held thermography system (). A generator () supplies current to a transformer () in a handle (). An induction coil () connected to the transformer () extends from the handle (). The induction coil () induces eddy currents in a test object (), producing a thermal topography on a surface () of the object () that reveals structural features including defects in the object. An infrared camera () mounted on the transformer () digitizes images of the thermal topography. A controller () processes the images, displays them on a monitor (), and stores them in a digital memory () for evaluation. Digitized positional data relating the position of the image to the surface may also be stored. An operator () presses a trigger (), signaling the controller () to start current to the induction coil () and simultaneously to acquire and process one or more images from the camera (). The images may be evaluated visually and/or by computerized analysis techniques for analyzing defects in the object.