The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Feb. 23, 2006
Applicant:
Albrecht Weiss, Linden, DE;
Inventor:
Albrecht Weiss, Linden, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract
A laser microdissection unit for cutting a microscopic sample using a laser beam of a laser includes a microscope and a fluorescence device. The microscope includes an illumination beam path directed onto the sample, and an imaging beam path configured to image the sample. The fluorescence device includes an excitation filter, a dichroic beam splitter, and a blocking filter. The dichroic beam splitter and the blocking filter are spectrally transparent to the laser beam, and the laser beam is directable through the dichroic beam splitter and the blocking filter onto the sample.