The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Aug. 02, 2006
Patrick Baroni, Les Ulis, FR;
Hakima Mendil, Thiais, FR;
Laurence Noirez, Orsay, FR;
Abstract
Method of determining at least one dynamic characteristic of a sample of a deformable solid or fluid material, comprising: the contacting of said sample () with at least one interaction surface (); the application of a relative movement between said sample () and said interaction surface (); and the measurement () of at least one dynamic or kinematic quantity in respect of the sample () and/or said interaction surface (), wherein said interaction surface () has an intrinsic wettability with respect to the material that is higher than that of metals. Device for implementing this method. According to particular embodiments, said interaction surface () is made of high-density sintered ceramic or made of single crystal silicon or germanium, preferably having a zero open porosity and an arithmetic mean roughness parameter of less than 12.5 μm and preferably between 0.4 and 1.6 μm.