The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2009
Filed:
Mar. 04, 2004
Naoki Hayashida, Tokyo, JP;
Tatsuya Kato, Tokyo, JP;
Kazushi Tanaka, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
A testing method capable of quantifying abrasion resistance on the translucent base surface of a high-recording-density optical information medium simply and in a form of reflecting an actual application environment, and judging criteria appropriate for the testing method. When an evaluation test in terms of abrasion resistance on a laser beam incident-side surface is conducted on an optical information medium to and/or from which recording and/or reproducing is made by a laser beam shone into an information recording layer from a translucent base side, and which has the focused radius R, of a recording/reproducing laser beam on the translucent base surface, of 40-400 μm, defined by the following expression (1) R=2T tan [sin(NA/n)](1) (in the expression, T is the thickness (μm) of the translucent base, NA numerical aperture of an object lens in the recording/reproducing device, and n refractive index of the translucent base), the abrasion resistance on a laser beam incident-side surface is evaluated based on the error amount of a reproduction signal after a laser beam incident-side surface is abraded by an abrasion wheel specified in ISO9352.