The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Mar. 31, 2005
Applicants:
Mario Blaum, San Jose, CA (US);
Roger Hoyt, San Jose, CA (US);
Inventors:
Mario Blaum, San Jose, CA (US);
Roger Hoyt, San Jose, CA (US);
Assignee:
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Geometrically-dependent error rates are used to identify sectors for XORing data in a RAID system for parity purposes in such a way that the probability of failure of any particular group is minimized.
Blaum, Mario. (2009). Raid system using regional error statistics for redundancy grouping (U.S. Patent No. 7484137). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7484137
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile