The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

Aug. 11, 2005
Applicants:

Keith P. Biegert, Cary, NC (US);

John M. Lake, Cary, NC (US);

Inventors:

Keith P. Biegert, Cary, NC (US);

John M. Lake, Cary, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and apparatus for configuring an application monitor utilizing discovered structural information for an application under test. A system for configuring an application monitor can include an application monitor disposed in a host computing platform. Also, the system can include an application inspector programmed to obtain snapshots of the host computing platform at discrete points of execution of an application under test. The snapshots can be used to identify differences in the host computing platform, and to configure the application monitor to account for the differences. Finally, the application inspector further can be programmed to acquire key system event data between the discrete points of execution.


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