The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

Dec. 18, 2007
Applicants:

Tsuyoshi Ide, Kanagawa, JP;

Spyridon Papadimitriou, White Plains, NY (US);

Inventors:

Tsuyoshi Ide, Kanagawa, JP;

Spyridon Papadimitriou, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exemplary method for computing correlation anomaly scores, including, defining a first similarity matrix for a target run of data, the target run of data includes an N number of sensors, defining a second similarity matrix for a reference run of data, the target run of data includes the N number of sensors, developing a k-neighborhood graph Nof the i-th node for the target run of data, wherein the k-neighborhood graph of the i-th node is defined as a graph comprising the i-th node and its k-nearest neighbors (NN), developing a k-neighborhood graphof the i-th node for the reference run of data, defining a probability distribution p(j|i), wherein p(j|i) is the probability that the j-th node becomes one of the k-NN of the i-th node, coupling the probability between the i-th node and the neighbors of the i-th node, determining an anomaly score of the i-th node, and determining whether the target run of data has changed from the reference run of data responsive to determining the anomaly score of the i-th node.


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