The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

Apr. 16, 2007
Applicants:

Kenny C. Gross, San Diego, CA (US);

Keith A. Whisnant, San Diego, CA (US);

Ayse K. Coskun, La Jolla, CA (US);

Inventors:

Kenny C. Gross, San Diego, CA (US);

Keith A. Whisnant, San Diego, CA (US);

Ayse K. Coskun, La Jolla, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/40 (2006.01); G01K 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention provide a system that characterizes the reliability of a computer system. The system first collects samples of a performance parameter from the computer system. Next, the system computes the length of a line between the samples, wherein the line includes a component which is proportionate to a difference between values of the samples and a component which is proportionate to a time interval between the samples. The system then adds the computed length to a cumulative length variable which can be used to characterize the reliability of the computer system.


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