The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Nov. 17, 2004
Angeliki Kotsianti, New York, NY (US);
Olivier Saidi, Greenwich, CT (US);
Mikhail Teverovskiy, Harrison, NY (US);
Angeliki Kotsianti, New York, NY (US);
Olivier Saidi, Greenwich, CT (US);
Mikhail Teverovskiy, Harrison, NY (US);
Aureon Laboratories, Inc., Yonkers, NY (US);
Abstract
Embodiments of the present invention are directed to quantitative analysis of tissues enabling the measurement of objects and parameters of objects found in images of tissues including perimeter, area, and other metrics of such objects. Measurement results may be input into a relational database where they can be statistically analyzed and compared across studies. The measurement results may be used to create a pathological tissue map of a tissue image, to allow a pathologist to determine a pathological condition of the imaged tissue more quickly.