The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Mar. 31, 2005
Hans Barschdorf, Dassendorf, DE;
Bernd R. David, Huettblek, DE;
Axel Thran, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a device for generating X-rays () comprising an electron source () for emitting electrons accommodated in a vacuum space (), a liquid metal circuit including a liquid metal for emitting X-rays as a result of the incidence of electrons and a pumping means () for causing a flow of the liquid metal through a constriction () where the electrons emitted by the electron source () impinge upon the liquid metal, and a radiation window () bounding said constriction (), which is transparent to electrons and X-rays and separates the constriction () from the vacuum space (). To provide a device for generating X-rays in which a cross-sectional area of the constriction substantially corresponds to an intended, desired cross-sectional area due to a self-regulating process without the need for external or additional components or electronics, it is proposed that said constriction () being bounded by a compensation window () opposite of said radiation window (), which separates the constriction () from a pressure chamber () containing liquid metal provided by said liquid metal circuit via a connection (), and which, during operation, has a profile (p') as a result of a deformation caused by a pressure in the pressure chamber () different from the pressure in the constriction () which substantially matches a profile (p) which the radiation window () has, during operation, as a result of a deformation of the radiation window () caused by a pressure of the liquid metal in the constriction ().