The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Dec. 08, 2006
Shin-ichiro Takagi, Hamamatsu, JP;
Kazuhisa Miyaguchi, Hamamatsu, JP;
Shin-ichiro Takagi, Hamamatsu, JP;
Kazuhisa Miyaguchi, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An X-ray imaging system is constituted of: an X-ray imaging device that includes a scintillator, which converts an X-ray image to an optical image, and an imaging element, which acquires an X-ray observed image by detecting the optical image generated by the scintillator; a first subtracter that performs a subtraction process between a first X-ray observed image, which contains a first noise image component, and a second X-ray observed image, which contains a second noise image component, to generate a noise image; a threshold value processing circuit that performs a threshold value process on the noise image to extract the first noise image component; and a second subtracter that subtracts the extracted first noise image component, from the first X-ray observed image to generate a noise- removed image.