The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

May. 06, 2005
Applicants:

Won Gi Jeon, Pyungtaek, KR;

Jeong Wook Seo, Pyungtaek, KR;

Jung Wook Wee, Namyangju, KR;

Ki Won Kwon, Seoul, KR;

Jong Ho Paik, Suwon, KR;

Dong Sun Kim, Incheon, KR;

Inventors:

Won Gi Jeon, Pyungtaek, KR;

Jeong Wook Seo, Pyungtaek, KR;

Jung Wook Wee, Namyangju, KR;

Ki Won Kwon, Seoul, KR;

Jong Ho Paik, Suwon, KR;

Dong Sun Kim, Incheon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and apparatus for detecting STBC-OFDM signals in time-variant channels. The method includes a step of demodulating STBC-OFDM modulation signals into OFDM reception symbols using Fast Fourier Transform (FFT); a step of estimating a frequency response for each sub-channel; an STBC decoding step of calculating decision variables determining the A transmit data symbols that are transmitted during the B OFDM symbol periods for each sub-channel; and a step of determining the transmit data symbols based on the decision variables calculated at the STBC decoding step. In this case, the decision variables are calculated using a linear equation that allows a squared Euclidean distance from OFDM reception symbols, which are demodulated during the B symbol periods, to have a local minimum for each decision variable when the STBC encoding and the frequency responses estimated during the B OFDM symbol periods are applied.


Find Patent Forward Citations

Loading…