The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Apr. 20, 2005
Applicant:
Peter Lehmann, Gottingen, DE;
Inventor:
Peter Lehmann, Gottingen, DE;
Assignee:
Carl Mahr Holding GmbH, Gottingen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measuring device () for measuring the shape, contour and/or roughness of a workpiece is based on a contact-less optical probe having a large numeric aperture. The probe has at least two different focal points with which at least two photo receptors are associated. The latter generate a differential signal for controlling a positioning device () for tracking the optical probe in such a manner that the workpiece surface is maintained within the measuring range of the probe. The differential signal is proven to result in a rapid and accurate tracking of the position of the sensor arrangement ().