The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Sep. 21, 2005
Jochen Strähle, Weissach, DE;
Jochen Strähle, Weissach, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An optical measuring device for measuring curved surfaces of a measured object. The curved surface to be measured may at least partially have the internal or external shape of a conical or cylindrical surface or of a saddle surface. The measuring device has a system of optical elements which includes at least one lens system and a first deflection optics. The lens system and the first deflection optics are positioned so that a first part of the light beams incident on the lens system is directed perpendicularly onto the curved surfaces of the measured object via the first deflection optics, while a second part of the light beams incident on the lens system is directed onto a reference object. Simultaneous measurement of locations of the measured object which are difficult to access and a reference object is thus made possible.