The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

May. 14, 2004
Applicants:

Keijirou Itakura, Ibaraki, JP;

Toshiya Fujii, Ohtsu, JP;

Akiyoshi Kohno, Yokohama, JP;

Yoshiaki Kato, Kusatsu, JP;

Inventors:

Keijirou Itakura, Ibaraki, JP;

Toshiya Fujii, Ohtsu, JP;

Akiyoshi Kohno, Yokohama, JP;

Yoshiaki Kato, Kusatsu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image defect correction apparatus that processes luminance signals output from two-dimensionally arranged light-sensitive elements via a plurality of vertical charge coupled devices and a horizontal charge coupled device in a predetermined order, outputs image information, and includes: a recording unit that records therein an X address for identifying a correction-target vertical line of pixels corresponding to a vertical charge coupled device in which a point defect exists; a correction value calculating unit that calculates a correction value from values of (i) a luminance signal corresponding to at least one pixel at a predetermined position on the correction-target vertical line identified by the X address and (ii) a luminance signal corresponding to at least one pixel at a predetermined position on another vertical line; and a correcting unit that corrects values of luminance signals corresponding to the correction-target vertical line, based on the calculated correction value.


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