The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Jun. 15, 2007
Gen Tsukishiro, Kasugai, JP;
Gen Tsukishiro, Kasugai, JP;
Fujitsu Microelectronics Limited, Tokyo, JP;
Abstract
A method for testing a semiconductor device incorporating a controller, which generates first and second complementary signals, and a memory, which operates in accordance with the first and second complementary signals. The method includes selectively switching the first and second complementary signals to an intermediate potential signal having an intermediate potential of the complementary signals. The method further includes conducting an operational test on the second device with the first and second complementary signals and the intermediate potential signal. This method enables detection of a defective connection between the devices.