The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2009

Filed:

Sep. 20, 2005
Applicants:

Bernhard Gleich, Hamburg, DE;

Juergen Weizenecker, Hamburg, DE;

Inventors:

Bernhard Gleich, Hamburg, DE;

Juergen Weizenecker, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method of determining a spatial distribution of magnetic particles in an examination zone, in which method a first magnetic field is generated, which forms in the examination zone a first sub-zone having a relatively low magnetic field strength and a second sub-zone having a relatively high magnetic field strength. The position in space of the two sub-zones is then changed by a second magnetic field, whereby the magnetization in the examination zone is changed. Signals dependent on the change in magnetization are acquired and evaluated to extract information concerning the spatial distribution of the magnetic particles. The second magnetic field is generated so that the time derivative of the second magnetic field is substantially identical for each spatial component.


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