The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Sep. 08, 2005
Applicant:
David A. Luce, Clarence Center, NY (US);
Inventor:
David A. Luce, Clarence Center, NY (US);
Assignee:
Reichert, Inc., Depew, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for measuring intraocular pressure of an eye use an empirically derived function wherein an inward applanation pressure Pand an outward applanation pressure Pobtained during a corneal deformation cycle caused by a fluid pulse are separately weighted so as to minimize cornea-related influence on the intraocular pressure value calculated by the function. In one embodiment, the function is optimized, at least in part, to minimize change in calculated IOP between measurements made before surgical alteration of the cornea and measurements made after surgical alteration of the cornea.