The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Apr. 15, 2004
Charles Jianping Zhou, Mountain View, CA (US);
Teh-ming Hsieh, San Jose, CA (US);
Charles Jianping Zhou, Mountain View, CA (US);
Teh-Ming Hsieh, San Jose, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A system and method for mapping software components (e.g., source files, binary files, modules) to test cases that test the components and providing rating information regarding each test case's effectiveness against its tested components. Each test case is applied to test a corresponding subset of the components, during which data are gathered (e.g., amount or elements of a component that were tested, which components were tested, time). Each test case is applied separately so that correlations between each test case and the corresponding subset of the software components can be recorded (and vice versa). A rating is generated to indicate how completely or effectively a test case covers a software component. A bipartite graph and/or other data structures may be constructed to map test cases to the software components they test, and vice versa.