The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Mar. 16, 2008
Peilin Song, Lagrangeville, NY (US);
David Heidel, Mahopac, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Franco Stellari, Waldwick, NJ (US);
Peilin Song, Lagrangeville, NY (US);
David Heidel, Mahopac, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Franco Stellari, Waldwick, NJ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
This embodiment replaces the use of LBIST to get a pass or no-pass result. A selective signature feature is used to collect the top failing paths, by shmooing the chip over a cycle time. These paths can be stored on-chip or off-chip, for later use. Once the chip is running in the field for a certain time, the same procedure is performed to collect the top failing paths, and this is compared with the stored old paths. If the order of the top paths changes, it indicates that (for example) there is a path (not the slowest path before) that slows more than others, which could be potential reliability concern. Therefore, a potential reliability failure is identified in the field.